Used JT JCP-2000 #9161612 for sale

JT JCP-2000 is a probe station designed for use with semiconductor, optoelectronic and microwave components in a laboratory environment. Its features include a 20-cm x 20-cm x 0.1-cm (8" x 8" x 0.04") working surface and an adjustable measurement range of -20°~ +200°C. JCP-2000 also incorporates a 3-axis adjustable gantry system with encoders on each axis that allows for precise positioning of the sample over a wide temperature range. This station also has five sensitive high-precision moving stages with X-Y, Z, Φ, and R axes. The X and Y stages are designed with 25 μm (0.001") resolution, making them ideal for making IR measurements. In addition, the stage for the Z axis is equipped with a stepper motor adjustment for fine-tuning of the gap between the probe head and surface. JT JCP-2000 is also equipped with a prober interface and a touch screen display control panel. The touch screen allows users to select a measure mode, configure the stage settings, set exposure time, and select the drive speed. The screen will display the measured profile data and analyze results in real-time. Additionally, the prober interface allows for connection to a standard PC for data storage and analysis. JCP-2000 is a versatile instrument that is ideal for measuring the electrical properties of semiconductor components under both temperature and applied mechanical stress. This makes it suitable for both basic research and development of components for many applications in the electronics industry. Its robust construction and advanced features provide reliable, accurate and repeatable experiments, making it a great choice for any laboratory looking for a prober station.