Used KARL SUSS / MICROTEC PA 200 #9268935 for sale

KARL SUSS / MICROTEC PA 200 is a microprobing platform, designed for fully automated wafer probing. It is capable of prodding with high accuracy and precision, making it an ideal choice for automated testing, characterization, and reliability testing. The system is available with various optoelectronic options and customizable components. MICROTEC PA 200 offers small probing area results and can accommodate up to three probing positioners, ideal for optimizing device performance. Its four 2D servo-controlled axes provide the capability to probe from very accurate probing coordinates. This includes very small probing force with minimal vibrations, as well as full-circle and half-circle pattern control. The platform features an intuitive user interface, allowing operators to quickly set-up and calibrate the system. Software tools automatically generate a comprehensive device characterization database and make sure the wafer meets pre-defined performance criteria. KARL SUSS PA-200 is designed for efficient wafer testing. Its high-performance image capture, fast wafer handling, and automatic error detection and correction allow the system to perform efficient wafer testing with minimal manual intervention. MICROTEC PA-200 is also designed to reduce costs by increasing throughput and efficiency, while decreasing downtime. KARL SUSS / MICROTEC PA-200 is also available with several accessories, such as a two-way pad selector and a five-way plate variator. The five-way plate variator is designed for precise temperature across a wide range of devices. It also features an integrated stepper motor and computer control to adjust the probe tip contact force. In summary, PA 200 is an excellent choice for automated wafer probing and other optoelectronic characterizations. It offers high precision and accuracy, along with customizable components and user-friendly software. Its efficient image capture, fast wafer handling, and automatic error detection make it an ideal choice for efficient device testing and reliability testing.