Used KARL SUSS / MICROTEC PA 300 #9401321 for sale

Manufacturer
KARL SUSS / MICROTEC
Model
PA 300
ID: 9401321
Vintage: 2003
Prober Does not include: Controller Joy stick PC 2003 vintage.
KARL SUSS / MICROTEC PA 300 is a high-precision prober for electrical re-testing of integrated circuits and semiconductor testing. It is specifically designed for the needs of wafer-level and PCB testing. The prober is equipped with a variety of features and capabilities, including a high-speed, high-precision 6-axis transmission module, a large area stage with full motion control, a tool-bar pattern recognition system, and a wafer edge detector. MICROTEC PA 300 prober has a transmission module that offers a high-speed, high-precision 6-axis motion suitable for accurate probing of components. The prober's two stepper motors, one for the X-Y axes and one for the Z axis, enable fast and precise manipulation of samples. The module also features a new three-axis control system for tracking the sample and accurately adjusting its position as needed. The prober's large area stage is capable of full motion control, allowing for greater accuracy and flexibility when probing samples. The stage is equipped with a servo motor for the X-Y axes, and a stepper motor for the Z axis. The prober also features the Tool-bar Pattern-Recognition System, which enables the user to quickly and precisely locate and position samples. KARL SUSS PA300 prober also has a wafer edge detector which provides an automated means of locating and aligning the wafer before probing. The edge detector can accurately locate the wafer within a range of ± 0.5 μm. This ensures that the prober can accurately probe the correct positions on the wafer. PA 300 prober is also equipped with advanced safety features such as an emergency shut-off and wafer clamping to provide protection during operation. Additionally, the prober complies with all applicable UL and cUL safety standards. Overall, MICROTEC PA300 Prober is a high-precision and accurate tool for electrical re-testing of integrated circuits and semiconductor testing. It is equipped with several features that enable users to accurately locate, position and probe samples. Additionally, it is compliant with all relevant safety standards.
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