Used KARL SUSS / MICROTEC PSM6 #9222846 for sale

KARL SUSS / MICROTEC PSM6 is a prober designed for semiconductor testing and package reliability. It is a compact and fully automated equipment for studying surface mount devices, devices with fine pitch, flip-chip, and multi-chip modules. MICROTEC PSM6 from MICROTEC offers automated probing, flexible probing patterns, and a variety of test routines. KARL SUSS PSM 6 features a system accuracy of 5µm, enabling a high level of accuracy when making contact with fine pitch devices. Its unique moving slide positioning unit, which is integrated with a precision air bearing and optical linear encoders, ensures the repeatable positioning of the probing head for reliable contacts. The prober can handle a wide variety of packages including SOICs, QFPs, CSPs, TQFPs, SOJs, BGA, and µBGA. The prober supports multiple probing patterns, which makes it easy to convert from one package type to another. This eliminates the need for manual conversion when testing different packages. In addition, the prober has programmable probing force control and adjustable pad compensation adjusting the contact force to a safe level to reduce contact damage. It also features an integrated fault location machine to reduce set up time and improved contact coverage. This helps to reduce downtime for production runs. MICROTEC PSM 6 also comes with various functional and design characteristics, such as an automatic wafer handling tool, quick-change mounting, and the ability to handle both manual and automated tests. Its laser alignment capabilities ensure a precise placement of the probe needles to ensure a better contact and reduce rework time. PSM 6 is designed to meet both EMC and safety compliance requirements, making it suitable for a wide range of test environments. It is reliable, robust, and is designed for long-term use. Moreover, it is backed up by a global support network providing technical support and service. Overall, KARL SUSS PSM6 is a high-performance prober with a variety of features and functions for performing accurate semi-conductor testing. It provides an automatic wafer handling asset, laser alignment, programmable probing force, adjustable pad compensation, and an integrated fault locator. The prober is designed to adhere to both EMC and safety compliance requirements, making it suitable for a variety of tests. Moreover, it is backed by a global support network providing full support and service.