Used MAPLE LEAF SD-100 #293601262 for sale

MAPLE LEAF SD-100 is a professional prober designed for microelectronics testing. It is a high-precision, high-end probing equipment with the ability to cover a large footprint area and move automatically to different points in the same way as a manual prober. SD-100 has an automated event control system. This unit records the movements of the probe as it scans a particular area. This machine also records whether the probe made contact with the chip or not during its scanning; this data is collected and stored in a database. MAPLE LEAF SD-100 is equipped with a precision probe assembly. This includes a number of probes that are specially designed for intricate microelectronics devices. These probes are able to reach around corners and into small spaces to capture the most accurate measurements with minimal contact. The prober is designed to be compact, durable, and lightweight. It is able to fit into tight spaces and is also modular. This makes it easy to reposition the probe to different points and arrangement, depending on the required testing. In addition, SD-100 has a modular structure that enables upgrading as new features become available. MAPLE LEAF SD-100 has an in-depth calibration features which allows it to measure nanometer-level accuracy while continuing to achieve maximum scanning and probing distances. It also has an easy-to-use touchscreen LCD screen with interactive menus, allowing users to easily configure the testing parameters to meet their exact requirements and for easy maintenance of the tool. In addition, SD-100 is capable of controlling up to four separate probes simultaneously, enabling flexibility for multi-level testing of complex and challenging devices. Furthermore, it has an integrated optical magnification asset that allows for very detailed probing, and a sophisticated interface for measuring and controlling the overall model. Finally, MAPLE LEAF SD-100 is equipped with a real-time monitoring equipment that allows users to ensure accurate and consistent results for all their testing needs. This system monitors the current location and voltage of the prober and compares it to pre-determined specifications. This ensures that any discrepancies can be quickly addressed.