Used MICROMANIPULATOR 2250 #9180599 for sale

MICROMANIPULATOR 2250 is a prober designed for use in surface-scanned measurement and probe card testing of semiconductor devices. It offers high speed, precision, repeatability, and accuracy. The equipment is capable of a wide range of automated testing, including precision probing, measurement, analysis, and characterization of a variety of device structures, both single and multilayer. 2250 includes a variety of technological features, making it an ideal choice for both standard and advanced semiconductor applications. At its core, it is equipped with a high-precision, aerostatic-bearing table. This provides the user with extremely accurate movement control, with sub-micron movements, and low thermal drift for improved accuracy and repeatability. In addition, the system is equipped with a high-accuracy, zero-backlash Z-stage capable of vertical travel of 200mm. This allows for very precise sample placement and probing. MICROMANIPULATOR 2250 also features an advanced semiconductor prober, with an advanced design enabling quick and reliable probing performance. It has a scanning area of 40x26mm, with the highest resolution of 1.5 um. The probe is capable of both contact and non-contact testing, making it suitable for a wide range of applications. It has a high-speed, 5-axis motion control unit, for fast motion and sample location. In addition, 2250 is equipped with a range of advanced measurement and analysis tools, making for a comprehensive measurement machine. It includes a wide range of scanning and imaging techniques, such as TV microscopy, atomic force microscopy (AFM), resistance imaging, capacitance-voltage (CV) profiling, capacitance imaging, and four-point probe methods. The tool also includes automated programmable measurement routines, that can quickly and accurately analyze and characterize devices with up to 30X faster data collection rates than traditional methods. In summary, MICROMANIPULATOR 2250 is a powerful and precise prober for semiconductor device testing and analysis. Its combination of high-precision motion control, advanced prober technology, and range of advanced measurement and analysis tools make it an ideal choice for demanding semiconductor applications.