Used MICROMANIPULATOR 6100 #9276056 for sale

MICROMANIPULATOR 6100 is a prober, engineered mainly for use in semiconductor testing. It is a multi-axis, integrated automation equipment specifically designed for performing accurate, non-contact, high-precision probing of test wafers and samples. 6100 utilizes an automated positioning architecture to achieve a high degree of repeatability and accuracy. Its oversize, passive-optical-feedback stage uses HPTC (High Precision Test Configurator) motion control technology to produce three-dimensional positioning accuracy in the nanometer range, while compensating for temperature and air-pressure fluctuations. The prober also features an integrated motion controller, which features user-friendly graphical programming software. The motion controller includes a probing algorithm capable of extracting the desired test points from a 3D CAD model, as well as a parameter-driven approach for developing automated testing procedures. The prober also features a vision system consisting of high-resolution, high-grade optics. It can be used to align the sample precisely and accurately before probing. The unit also provides automated sample identification and integrity checks for ensuring sample compliance prior to probing. MICROMANIPULATOR 6100 also offers a variety of probes to suit the specific requirements of various applications. It offers probes compatible with various test wafer materials, including a DC probe for measuring VDQS and VCDQS, and an AC probe for measuring voltage and current fluctuations. The built-in wafer-load mechanism is designed to prevent damage to wafers during loading and operation. The prober can also capture detailed graph images of circuits and devices, allowing precise analysis of their performance. Its support electronics machine also features DC voltage and current sources, as well as a range of other DC/AC test tools and accessories, such as drivers, amplifiers, and capacitors. 6100 is a robust prober suitable for a variety of industrial applications, offering high- precision testing for various semiconductor devices and materials. It is designed for maximum ease of use and cost-effectiveness and can be used for both on-site and laboratory testing.