Used MICROMANIPULATOR 6640 #138584 for sale

MICROMANIPULATOR 6640 is an advanced prober designed for high precision analysis and manipulation of small, delicate electronic components and components assemblies. This advanced prober equipment includes a motion-controlled two-axis stage that can be programmably operated through advanced software allowing precise control of the probing and manipulation arms. The x-axis can be moved across the wafer quickly using advanced frictionless guidance, while the theta-axis enables precise monitoring and manipulation of the probe tip to within 200 nm or better. 6640 system consists of a CAM controller, a microscope stage, a manipulator arming unit, a programmable motion control panel, a probe tip positioning stage, and a power supply unit. The CAM controller allows pre-programmed movements as well as live control of the probe head, with repeatable accuracy within 200 nm or better. The microscope stage enables the wafer to be positioned for precise examination under a microscope and the manipulator arming machine features adjustable probe arms for optimum repeatability and precise operations within the operating temperature range. The programmable motion control panel is ideal for precise manipulation in a precise way, with programmable triggers for specific test operations and repeatable moves for wafer positioning. The probe tip positioning stage features fractional turns for precise testing, with precise positioning up to 40 degrees. The power supply unit provides the optimal power supply for precise testing and precise control of the probe head. MICROMANIPULATOR 6640 tool also includes a range of accessories and tools, including an automatically adjustable probe tip holder, a range of high accuracy manipulators, a range of NIST-traceable probes, and an electronic microscope viewfinder. The automatically adjustable probe tip holder provides precise positioning at the needle holder, while the high accuracy manipulators provide dynamic control of the probe tip to within 200 nm or better. The range of NIST-traceable probes ensures that tests are carried out using the correct probes for the job. Finally, the electronic microscope viewfinder provides real-time visualization of the wafer for accurate examination. In conclusion, 6640 is an advanced prober designed for precise testing and manipulation of delicate components and components assemblies. The asset includes a range of high precision components and accessories that provide precise control of the probe head to within 200 nm or better, while providing complete control and testing of the wafer under a microscope. The model is perfect for precise inspection of delicate components and assemblies.