Used MICROMANIPULATOR 9900 #9167747 for sale

MICROMANIPULATOR 9900 is an advanced prober equipment designed for probing integrated circuit wafers. The system is capable of probing with a resolution of 40 microns and can accommodate a wide range of IC wafer sizes, ranging from 50 to 800 millimeter diameter. The unit has an integrated closed-loop design and can be interfaced with other existing prober systems. The prober consists of a main frame, a stage, and a control unit. The main frame is made of heavy-duty aluminum and covers an area of approximately 1.5m x 1.5m. It includes a pressurized sprung loading platform that provides a stable environment for the wafer to be tested, as well as an integrated probe positioning machine, the latter consisting of a TTL computer-controlled 3-axis linear motion device for fast and accurate positioning. The platform also features a 4-position loading port, and a tool changer for accessing a wide range of probes. The stage is the main moving part of the tool and is a hexapod design that allows precise tilt and elevation motion for wafer testing. It includes a backlash-free servo loop with a settable precision of 0.1 mm over a range of 70 x 70 x 8 mm and is capable of a maximum speed of 15 mm/s. The level of accuracy is suitable for IC probing and can also accommodate a variety of substrate types. The control unit of 9900 is comprised of industrial PC and an associated programming software suite. It enables the user to set up and calibrate the asset for high-level accuracy probing, as well as creating automated test routines. The user interface is easy to use, and provides access to a wide set of parameters including probe placement, probe force, direction and speed controls, as well as handling of the wafer. In conclusion, MICROMANIPULATOR 9900 is an advanced prober model designed for probing integrated circuit wafers. It provides closed-loop control capabilities, precision of 0.1 mm, the ability to handle a variety of wafer sizes, and an easy-to-use interface, making it an ideal choice for IC testing and probing.