Used MICROMANIPULATOR PROBE STATION #293634835 for sale

A MICROMANIPULATOR PROBE STATION is an automated prober equipment used for comprehensive electrical characterization of semiconductor devices. It combines the convenience of manual probing with the precision of automated testing. The automated PROBE STATION includes precision micrometers with positioning accuracy better than 5 µm, Z-axis translation stages, XY translation stages and rotary stages, providing six-degree-of-freedom motion control. Its specialized software and hardware systems enable fast wafer exchange and alignment, together with precise electrical measurements. MICROMANIPULATOR PROBE STATION system allows for great flexibility in probing, characterization, and testing. It consists of three main components, a prober and two preparation areas (for electrical and thermal conditioning). The prober is used to align and connect test roomasd probes to the wafer under test. The electrical preparation area contains the necessary components to perform electrical tests, while the thermal conditioning area is designed to accommodate high temperature range up to 300°C. The prober station can also be equipped with various additional features, such as electrometers, current measurements, and capacitance meters. These features are used for complex tests that require precise voltage and current measurements, as well as for failure analysis of semiconductor devices. In addition to these basic components, the prober station can be equipped with a variety of accessories and upgrades. These include an electronic microscope, an automatic wafer mapping unit, an automated handler, and intelligent optics systems. The automated handler helps in wafer exchange and alignment, while the electronic microscope allows for observation of wafer under test. The intelligent optics machine is used for precision alignment of probe tip to the device. PROBE STATION forms a reliable automated platform for electric characterization of integrated circuits, enabling a wide range of measurements, detailed inspection and analysis. The flexibility of its features and components are highly advantageous in obtaining accurate, comprehensive and repeatable results in a wide range of semiconductor applications.