Used MPI-FC LEDA-8S P7202-110 #9181610 for sale

MPI-FC LEDA-8S P7202-110 is a highly reliable prober that is designed for precision wafer probing applications in automated semiconductor test and measurement equipment. This prober uses a fully-integrated 1-D Laser Doppler Vibrometer (LDV) sensor that is optimized for precise measurements. The LDV sensor works in concert with a linear actuator and precision optics to detect high-frequency signals on the surface of a silicon wafer. The use of LDV sensing enables the prober to detect tiny vibrations and deformations on the surface of the wafer, thus enabling highly accurate measurements of the wafer's performance characteristics. The LEDA-8S's advanced control equipment allows users to control the prober with a range of tailored probing sequences, tuned for different types of wafer probe measurements. Specifically, the system can be configured to perform surface-mapping during a single wafer probing cycle. Further, the oscilloscope-like graphical user interface of the prober allows the user to visualize the on-screen data that the LDV sensor collects. The prober also supports various programming languages such as Python and C++, allowing users to create tailor-made control tracking and data extraction processes. The LEDA-8S unit is equipped with standard features for ease of use and maintenance, such as automatic calibration, an auto-cleaning machine, and magnetic quick-connect cables. Furthermore, the prober is compatible with standard automation protocols and has a high signal-noise-ratio, enabling accurate and reliable measurements. The notable features of LEDA-8S P7202-110 make it an ideal choice for large-scale wafer probing applications, such as high performance semiconductor detection, heat transfer analysis, and stress-testing.