Used MPI-FC LEDA-8S P7202 #9181615 for sale

MPI-FC LEDA-8S P7202
Manufacturer
MPI-FC
Model
LEDA-8S P7202
ID: 9181615
Vintage: 2008
Testers 2008 vintage.
MPI-FC LEDA-8S P7202 is a fully automated probe station designed for high precision probing of a wide variety of device structures. It is especially suitable for probing small area microelectronics and optoelectronics substrates such as VLSI, ULSI, OLED, MEMS and NVM. The probe station is designed to handle wide range of substrates up to 25mm × 15mm and substrate thickness up to 1.1mm. MPI-FC LEDA-8S comes with an Ultra High Vacuum (UHV) module to reduce electrical crosstalk during testing. The automated probe station can be used for various purposes such as probing and characterization of small structures, 6point & 8point multi-site testing of RF-related components, optical device sensing and general imaging applications etc. It features a user friendly intuitive aluminum Graphical User Interface (GUI). The motorized XY stage with manual milling table allows for precise placement of the probe with up to 5um resolution. Also, a 70mm objective gives greater visibility of the features being probed. LEDA-8S P7202 is designed to optimize the probing process by reducing set-up time and providing user with increased repeatability. Its design features four specialized probes, three enclosed in a guide sleeve, and another probe which is directly attached to the UHV module. MPI-FC LEDA-8S has a superior electrical performance in terms of impedance and crosstalk over its non-UHV version. The closed loop optical autofocus system delivers excellent repeatability and accuracy. MPI-FC LEDA-8S P7202 offers optimal performance for various types of probes including RF, optical, boundary and inverted probes. It is equipped with an RF controlled High Voltage supply with boost control to maximize performance and accuracy. It is also compatible with a wide range of Semiconductor test equipment. In conclusion, LEDA-8S P7202 is a high precision automated probe station which is designed for high precision probing and testing of a wide variety of device structures and components. With its various features such as superior electrical performance, user-friendly interface and closed loop autofocus system it provides optimal performance in terms of accuracy and repeatability.
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