Used MPI LEDA-8F #9258049 for sale

Manufacturer
MPI
Model
LEDA-8F
ID: 9258049
Vintage: 2010
Point measuring system 2010 vintage.
MPI LEDA-8F is a professional prober developed by MPI Corporation for semiconductor testing and scanning. It offers precise probing, and can handle an array of different test probes, such as Kelvin connectors, GPIB-controlled NAND probes, and electrostatic discharge (ESD) protection. LEDA-8F can control up to 8 test probes, allowing users to analyze and diagnose IC devices more quickly and accurately. It is equipped with consistent probe pressure and accurate X, Y, and Z axis motion, as well as a real-time, advanced vision system for alignment and visualization. This system functions in both manual and automatic modes, providing ease of use. MPI LEDA-8F automatically and simultaneously measures parameters such as voltage, current, impedance, capacitance, and temperature on IC devices with its high-precision probing system. It also has a variety of built-in safety features, such as automatic contact protection and a means of controlling EMI(electromagnetic interference). LEDA-8F allows users to improve accuracy and speed in their testing procedures, thanks to its advanced PID(proportional-integral-derivative) control algorithm and its high-speed core processor. This algorithm monitors and adjusts the feedback from its Z-axis motion, ensuring that test probes are always positioned correctly. It also reduces latency, as the core processor can process data more quickly than conventional algorithms. MPI LEDA-8F also has two independent memory slots, enabling users to store multiple test plans and configurations. This allows users to quickly switch between different probing setups, making testing procedures easier and more efficient. It also features comprehensive software control interfaces, including RS-232 serial communications and USB. Overall, LEDA-8F is a highly advanced professional prober. With its precise probing systems, intuitive software, and built-in safety features, it is a great option for testing and scanning activities in the semiconductor industry.
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