Used MPI LEDA-AS M76XL #9170676 for sale
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MPI LEDA-AS M76XL is a prober designed specifically for the inspection and engineering of semiconductor devices. This equipment is an integrated production tester and inspection station, offering efficient testing and equipment evaluation. The M76XL includes a self-loading dual-pressure probe system, temperature controllable chuck, surface dissection microscope, and MPRF (Multi-Position Reticle Fixture). This high-performance prober unit has precision accuracy and a touch-screen display for easy navigation and operation. The M76XL includes an integrated dual-pressure probe machine that automatically sets each probe according to the test program parameters. This reduces the time required for operator adjustments and allows for easier setup. Additionally, the tool features a sub-micron resolution that allows for precise measurements of devices under test. The M76XL prober has a temperature-controlled chuck to precisely control the temperature to the device being tested. This helps maintain stability and accurate testing results. The asset also has an optical microscopefor surface dissectioning that ensures the quality of the device's fine wires and other elements. The M76XL has a built-in Multi-Position Reticle Fixture (MPRF) which enables efficient testing of multiple devices at once by supporting up to three plates in a single prober station. This allows for quick setup and extensive analysis at once. The prober has a 12-inch touch screen display with a graphical user interface for easy navigation and operation. The programming interface allows for seamless integration with CAD software for creating and exporting programs in a variety of formats for easy testing. This helps ensure accuracy in testing and shortens time-to-results significantly. Overall, LEDA-AS M76XL prober model is a reliable, efficient, and accurate tool for the semiconductor testing and engineering. Its features make it a great choice for companies looking for reliable and precise testing and evaluation of devices.
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