Used MPI LEDA-P7202 #9258060 for sale

MPI LEDA-P7202 is a state-of-the-art, contactless prober and contactless probe positioning equipment which offers a wide range of capabilities for wafer testing and analysis. The prober is equipped with a vertical scanning mechanism to ensure precise alignment of probes to wafer surfaces. The wafer placement system is designed for mass production processes and can be used to process multiple wafers simultaneously. The prober features a unique and complex set of functions which ensure precise wafer positioning and probe alignment for optimum performance. This includes a multi-sensor positioning unit which utilizes large area pattern recognition and customized algorithms to analyze the topography of the wafer surface. Additionally, the machine contains a 3D wafer alignment mechanism which can be adjusted to align the probes with wafer components quickly and accurately. Furthermore, the prober also contains an ultra-high precision wafer clamping mechanism which can generate up to 50 Newtons of clamping force, allowing secure and stable wafer handling. The prober also features an integrated wafer and probe lift tool which prevents damage to the wafer during the probe alignment process. The lift asset can be adjusted to a maximum of 50 mm and is independently controlled via a hand-wheel or through a PC, while providing precise and repeatable positioning of the wafer and probe. Another important feature of this prober is the automated compensation model, which automatically adjusts the wafer position to compensate for thermal drift and vibration. The prober also includes a high-resolution imaging equipment which can be used to inspect the results of the wafer testing without having to mechanically contact the wafer. This system includes a digital camera, laser illumination, and software for image analysis, allowing users to acquire accurate and reliable data. Additionally, the prober can be equipped with many other optical systems, such as an optical microscope, IR and UV spectrometers, X-ray imaging, and Fourier transform digital interferometry systems. Finally, the prober can be controlled remotely, either through a dedicated software, or a graphical user interface. This allows users to quickly and easily program the unit, setup wafer testing protocols, and run automated processes. The prober is also compatible with many industry standard interfaces, such as USB, GPIB, RS-232, and Ethernet. Overall, LEDA-P7202 is an ideal prober for precision wafer testing and analysis, providing high-level performance and reliability. It utilizes cutting-edge technologies and features which ensure accurate and efficient probing, and can be easily deployed and operated in high-volume production environments.