Used MPI TS3000-SE #9363628 for sale
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ID: 9363628
Wafer Size: 8"-12"
Probe station, 8"-12"
Can be possible to heat the cooling substrate
KEITHLEY 4200A-SCS Parameter analyzer mainframe
With LCD display, 15.6"
(4) KEITHLEY 4210-SMU
High power source-measure unit for 4200A-SCS
Resolution: 0.2 uV, 100fa
Power: ±210 V, ±1 A
KEITHLEY 4210-PA
Remote preamp option for 4200-SMU / 4210-SMU
SMU Resolution: 0.1fa
Module to extend capacitance-voltage measurements:
KEITHLEY 4210-CVU
Capacitance voltage: 1 kHz - 10 MHz
±30 V Built-in DC bias
±210 V DC Bias with SMU
KEITHLEY 4200A-CVIV
I-V/C-V Multi-switch module
DC I-V and C-V With automatic switching.
MPI TS3000-SE is a prober developed by MPI Corporation as a high-performance interconnect test platform. TS3000-SE enables automated test of hundreds of test structures with precision measurement capabilities. It has a modular, integrated platform capable of testing high performance, high-speed generation and high-speed serial I/O protocol interfaces. Additionally, the equipment was designed to provide high accuracy, test speed, and ease of integration with test and development systems. MPI TS3000-SE prober is equipped with two types of probes: the standardprobe, which is designed to perform testing at up to 6 GHz, and the high-speed probe, which is capable of testing up to 8 GHz. Additionally, the system is capable of supporting a wide array of rigid and flexible adapter cards for testing large-scale assemblies. In addition to testing high speed serial I/O protocols, the prober is capable of performing a variety of I/O stress testing and digital set-up tests. Furthermore, the unit is able to make precision in-circuit measurements of components and traces on the device under test. The prober is also capable of supporting a variety of test automation tools such as test scripts, pass/fail criteria, and automated report generation. This allows the testers to quickly and accurately obtain results from their tests. Additionally, the machine is capable of supporting a wide variety of test and analysis tools, making it a versatile platform for testing and development. Overall, TS3000-SE is a flexible and versatile test platform designed to meet the needs of a wide variety of applications. With its high accuracy, test speed, and ease of integration, it is an ideal platform for testing high-performance, high-speed individual and complex assembly I/O Interfaces.
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