Used MULTIPROBE MP1 #293777603 for sale

Manufacturer
MULTIPROBE
Model
MP1
ID: 293777603
Wafer Size: 8"-12"
Vintage: 2007
Atomic Force Prober (AFP), 8"-12" 2007 vintage.
MULTIPROBE MP1 prober is a high-performance wafer probing tool designed for probing or "testing" semiconductor wafers. It is designed for automated high-volume production and thorough quality assurance of a wide variety of wafer types, such as silicon, gallium arsenide, and gapless gallium nitride. The prober includes a combination of high-speed probes that have a wide range of test capabilities. The high-speed probes reduce test times and ensure all aspects of the wafer are tested in a timely and accurate manner. This allows for quick turnaround of wafer results and faster feedback to users. Additionally, the prober features a scanning system for complete wafer surface coverage, ensuring probe testing accuracy. The prober also has two temperature control systems with independent temperature control for the wafer and prober stages. This feature ensures accurate probe testing is achieved for different wafer types and temperatures and covers a wide range of operating temperatures ranging from -25°C to +125°C. The prober has superior accuracy and provides high repeatability of probe tests over time and across similar wafers. It features advanced process control technology that helps users set process parameters in minutes and monitor the whole manufacturing process for quick wafer turn-around. It also has an intelligent communications bus that enables data transfers for compatible test systems and equipment. The prober also has four independent wafer loaders that are capable of loading multiple wafers at the same time. This feature allows for efficient and rapid test data collection and batch testing, as well as automation of testing through the use of an integrated programmable logic controller. Additionally, the prober can be integrated with other production equipment for further accuracy and efficiency. In short, MP1 prober is an automated high-performance wafer testing tool designed for a variety of wafer types. It features high-speed probes, temperature control, advanced process control and monitoring capabilities, an intelligent communications bus, and four independent wafer loaders. With its numerous capabilities, the prober provides a solution for fast and efficient wafer testing, ensuring accurate results for the user.
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