Used MULTIPROBE MP1 #9271049 for sale

Manufacturer
MULTIPROBE
Model
MP1
ID: 9271049
Atomic Force Prober (AFP).
MULTIPROBE MP1 is a prober used in testing integrated circuits (ICs) in both research and production environments. It operates as a multi-channel wafer prober that can test multiple ICs simultaneously. It is designed to test up to five ICs at the same time on a single, small-diameter wafer. MP1 is a hybrid prober that combines advanced ohmic test technology with IC testing capabilities. It is a compact, modular unit that has a unique probing architecture, making it both efficient and accurate. The prober features a 5-axis extended arm which can be configured to reach all five ICs at once. The arms are designed to be highly sensitive to rapid motion due to their fine motors and to precisely control and position a wide variety of probe cards. In addition, MULTIPROBE MP1 has advanced field-programmable gate array (FPGA) processors that are responsible for controlling the prober's multiple signal paths. The prober's hardware consists of two main components - the test head and the maneuverable arm that holds the probes. The test head is the main unit that supports both the logic and measurement electronics. It features advanced signal measurement capabilities with various input/output interfaces, such as Ethernet, GPIB, USB, and parallel ports. The maneuverable arm is connected to the test head and supports the probes as they move into the ICs. Up to five probes may be attached to the arm, each placed where needed on the wafer for testing. The arms are designed for rapid, accurate motion and control and are sensitive to slight movements. MP1 comes equipped with a user-friendly, intuitivable graphical user interface (GUI). This intuitive interface provides easy access to all the features and functions of the prober. It also has advanced software functions, such as virtual prober control, as well as a variety of tools for troubleshooting and verifying test results. In conclusion, MULTIPROBE MP1 is a powerful and versatile prober. It is designed to test up to five ICs simultaneously and is equipped with advanced signal measurement capabilities and intuitive software functions. It features a 5-axis arm for precise control and positioning and has a user-friendly GUI for intuitive access to its features and functions.
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