Used MULTIPROBE MP1 #9298959 for sale

MULTIPROBE MP1 is a high-performance prober designed for use in semiconductor failure analysis and reliability labs. It is capable of measuring a wide range of dimensions to a high level of accuracy and precision, enhancing the capability of a modern failure analysis laboratory. MP1 comes equipped with a high-precision Z-axis stage which is capable of moving the probe tip with a resolution of 1 nm and a repeatability of 5 nm. It can also measure the smallest of features, with an X-Y stage resolution of 5µm and repeatability of 5 nm. The Z-axis is motorized for ease of positioning and scanning in 3-D. MULTIPROBE MP1 is equipped with a "contact trigger" feature that actively detects and captures contact between the probe tip and the sample, making it easier to measure the very small feature sizes on the sample. The prober features a state-of-the-art visioning system with several measurement options such as "3D scanning," "continuous line scanning," "area scanning," and "pattern matching." This visioning system improves the overall inspection accuracy and enables the automatic detection of defects. MP1 is also capable of high-quality imaging, which allows minute features to be identified and analyzed. It can record and store both images and data in various formats including JPG and PNG, thus providing valuable and useful data for failure analysis. MULTIPROBE MP1 is designed to be easy to use and handle with its simple and convenient interface. It offers a variety of output options to suit the specific requirements of any failure analysis and testing processes, ensuring that accurate and precise measurements are obtained in a timely manner. In addition, MP1 is backed by a comprehensive warranty and a dedicated support team to ensure that the prober remains in proper working condition. This ensures that MULTIPROBE MP1 is reliable and suitable for many years of laboratory use.