Used NBK MPS-200 #9397408 for sale

NBK MPS-200 is an advanced prober designed to accurately measure and inspect wafer structures, particulate contamination and other defects in the semiconductor industry. It is equipped with advanced functions to improve analysis accuracy and reduce analysis time and cost. MPS-200 is equipped with a high-performance stepper motor that can detect every movement, enabling high-precision alignment and repeatability of measurements. It has a 0.7-micron XY resolution and can operate in a variety of wafer sizes. Its depth of focus is also extended to accommodate a wide ranges of carrier thickness and particle size. NBK MPS-200 can be configured with a variety of options such as an extended X/Y Area, Auto-Calibration Station, Vacuum Handler, Automatic Probe Retract Equipment and Diagnostic System. The Auto-Calibration Station allows for high-accuracy image acquisition and a stable position for fine measurement. The Vacuum Handler provides wafer pickup, holding and placement with a vacuum unit that reduces vibration and improves stability and accuracy. The Automatic Probe Retract Machine ensures that probes can be installed and retracted safely and quickly during transfer and measurement. Other features of MPS-200 include low vibration, low noise, high accuracy, high measuring speed and high performance multimode infrared scanning and thermal analysis. With NBK advanced algorithm, it can detect and locate any defects on wafer surfaces with a repeatability of plus or minus 0.3um and a sensitivity of at least 0.01um. In addition, NBK MPS-200 is equipped with a high-performance image processing tool and archiving functions, enabling the user to store measurement records in a secure database. This ensures repeatability and accuracy of measurements and inspections. In addition, it is capable of the integrated analysis of data from multiple measuring systems, enabling it to accurately identify the relationship between wafer surface features and other factors. In summary, MPS-200 is an advanced prober designed for reliable and accurate wafer measurement and inspection. It features advanced functions to help improve analysis accuracy and reduce analysis time and cost.