Used NIHON MICRONICS 705A-6 #9086338 for sale

NIHON MICRONICS 705A-6 prober is a specialized tool allowing for the automated testing of semiconductor devices. It is designed to accurately and quickly measure parameters such as electrical resistance, capacitance, and other physical characteristics of devices. The prober is equipped with 6-axis motion capabilities allowing it to move the probes in a precise manner around the device to take accurate measurements. Additionally, the prober has a zoom function that allows for close-up measurements of individual devices. The probe has a resolution of 0.0001 mm and is capable of being placed into contact with the device within 1 µm accuracy. The prober is equipped with a three-dimensional measuring system, allowing it to take measurements of multiple devices simultaneously, using a single probe head. This system consists of advanced vision sensors, which allow the prober to accurately identify the edges of the device and take the required measurements. In addition, the prober is capable of automatically sorting the devices based on their test results. Utilizing a sophisticated sorting algorithm, the prober is able to quickly identify good or bad devices, assigning them to individual bins for later processing. Finally, the prober has a wide range of software packages, allowing for a range of test scenarios and analysis. These software packages can be used for error analysis, electrical measurement analysis, and testing of multiple types of devices under different conditions. Overall, 705A-6 prober is a powerful tool for testing and analyzing semiconductor devices. Its advanced motion capabilities, accurate measuring system, sorting capabilities, and range of software packages, make the prober an invaluable tool for any semiconductor lab.