Used OMNIPROBE Autoprobe 200 #9380107 for sale
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OMNIPROBE Autoprobe 200 is a semiconductor prober that is used in the testing and analysis of semiconductor chips. It is designed to measure the electrical properties of devices such as transistors, capacitors, resistors, digital logic gates and integrated circuits. It is able to provide a high degree of accuracy due to its use of a proprietary wafer assembly limiting the vibration due to the probe assembly movement. Autoprobe 200's key feature is its capability to accurately repeat measurements and automated prober sequences. This is due to its long-range x-y positioning equipment that can be operated up to a maximum speed of 400mm/s and 50mm/s. It is also able to accurately repeat measurements due to its closed-loop position feedback system that updates its position along the x and y-axes. The prober can also measure temperatures up to 400°C, which is ideal for testing high-power and pulse-width modulation devices. To ensure accurate measurements, the unit features a patient thermal management machine that can apply precise temperature control to the device being tested. Furthermore, the prober include thermal compensation for temperature fluctuation in order to provide consistent measurements. In addition to providing accurate repeatable measurements, OMNIPROBE Autoprobe 200 is capable of handling various types of semiconductor wafers and encapsulated packages. It features a double-sided prober that can handle single-side, dual-side, as well as four-sided testing capabilities. It also features a vacuum detection that can detect the presence of vacuum in the autoprobe chamber which is necessary for wafer testing. Lastly, Autoprobe 200 is equipped with a comprehensive user interface with visual feedback and data logging capabilities. This allows users to quickly and easily configure, execute, and monitor the performance of the prober without much difficulty. OMNIPROBE Autoprobe 200 is a reliable and accurate piece of technology that is commonly used in semiconductor testing and analysis.
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