Used ORIEL 6535 #9101739 for sale

ORIEL 6535
Manufacturer
ORIEL
Model
6535
ID: 9101739
Mini probe control unit.
ORIEL 6535 prober is a precision probe station that allows electrical characterization of samples at the device, wafer, or module level. This prober is designed to interrogate sample devices under various temperature and humidity conditions. It is equipped with a range of capabilities including high-speed device measurements, precision contact propping and probing motion control, accurate contact force monitoring, and precise thermal control. This unit is designed for high-resolution, accurate, and reliable probing for a variety of applications. It provides sample device characterization at temperatures solid-state ranges from 0 °C (32 °F) to +150 °C (302 °F). This prober has a static contact load up to 6.8N (1.5 lbs.) with a limit to 9.4N (2.1 lbs.) and a dynamic contact load up to 13.6N (3.0 lbs.). It also features a low-pass filter pass rate with a maximum of 0.05 dB at 10 MHz for high-speed testing. 6535 supports a wide range of probing forces of up to 20 mN in accordance to the IEEE 1685TM-2005 Prober Standard. It also supports dual-probe motion capability, which allows for contact propping and probing simultaneously. ORIEL 6535 is capable of measuring and monitoring electrostatic discharge (ESD) and thermal parameters. The unit is equipped with a temperature management module featuring precise digital fluoropolymer Peltier elements and thermistor monitoring for accurate thermal control over sample devices. It also supports precise two-zone thermal control up to 150 ºC for precise thermal characterization of sample devices. The probe station system is powered by a powerful PC and allows easy programming and automation of inspections from sequence generation. Its integrated software platform allows easy access to data collection for advanced analysis and data logging. It also supports test sequences containing multiple parameter sweeps and rapid statistical data comparison. Overall, 6535 is an advanced solution for precision probe station inspection and characterization. The unit is ideal for automotive, aerospace, medical, and high-reliability applications that require precise electrical probe measurements. Its integrated features enable high-resolution, reliable measurements that enable reliable testing and analysis of sample devices.
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