Used PACIFIC WESTERN SYSTEMS / PWS P5MS #9196396 for sale

PACIFIC WESTERN SYSTEMS / PWS P5MS
ID: 9196396
Wafer Size: 6"
Wafer prober, 6" Tester Process: Metrology Missing parts: Power supplies.
PACIFIC WESTERN SYSTEMS / PWS P5MS is a prober designed for high-end probing applications in semiconductor and microelectronics production. It combines a number of features to ensure efficient operation in a variety of settings. PWS P5MS prober is equipped with an advanced wafer jogger equipment. This allows smooth and accurate wafer handling for testing without sacrificing accuracy. The prober also includes a sensitive displacement measuring system that improves its ability to recognize changes in position and to accurately detect any potential problem. The unit is also designed with a high-resolution video optics unit to ensure the highest accuracy possible. The machine is capable of providing reliable and repeatable results, even under challenging conditions. Other features include a vacuum/compound tool for wafer preparation and handling, as well as advanced motorization and control systems to ensure accurate and repeatable testing. PACIFIC WESTERN SYSTEMS P5MS is designed for both manual and automatic operation. A customizable graphical interface makes operation easy, and the prober also offers variable scan speed control, allowing for precise stage motion and data collection. P5MS also features an integrated high-resolution analysis asset. This allows for creating customized probing jobs for the prober. Furthermore, its capabilities also extend to test pattern capture and analysis, allowing for data collection, analysis and interpretation. The prober is further complemented by a number of other features. The prober is compatible with numerous device and probe cards, allowing for a large variety of applications. It can also be controlled remotely with PWSNet and is interoperable with various test systems and automated wafer handling systems. Overall, PACIFIC WESTERN SYSTEMS / PWS P5MS is a highly advanced prober designed to meet the needs of the most demanding applications in the semiconductor and microelectronics production processes. By offering high accuracy and a variety of features, it can easily incorporate into existing systems and provide reliable results for any testing requirements.
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