Used PACIFIC WESTERN SYSTEMS / PWS Probe II #9172424 for sale

PACIFIC WESTERN SYSTEMS / PWS Probe II is a high-speed prober designed to inspect and evaluate the topography of semiconductor integrated circuits and wafers. The prober features a robust and reliable design and is capable of executing advanced probing techniques. PWS Probe II features a high-speed optical scanning equipment that enables it to quickly scan wafers, accurately capturing topography information. The system is designed to minimize shear and tilt distortion during contact force settling and execution of probe scans. This minimizes the effects of dust, debris, and other contamination on the test results. The prober also features advanced test set planning and execution capabilities. This includes advanced algorithms that take into account probe density, pad position, size, shape, distance constraints, and more. This ensures that the test series planned will identify potential faults with the highest accuracy. PACIFIC WESTERN SYSTEMS Probe II is also designed with a graphical user interface. This enables users to quickly set up and execute tests, taking visual feedback into account when correcting test results. The user is also able to create custom probing profiles that adjust results according to the specific requirements of the application. The user can also save test results to an offline database for data analysis and review. Probe II uses advanced algorithms to automate probe contact and mapping as well as wafer search and alignment. This significantly reduces the time required to take measurements and subsequently analyze the data sets. The unit also makes use of high intensity LED lighting to ensure uniform illumination of the analyzed surface. In addition, PACIFIC WESTERN SYSTEMS / PWS Probe II is designed with a modular construction, enabling users to easily adapt the machine to fit specific needs. The modular components can be easily swapped or replaced when needed, saving time and money. Overall, PWS Probe II is a robust and reliable prober, capable of quickly and accurately capturing topography information. It features advanced algorithms for test set planning and execution as well as visual feedback. Its modular construction enables users to customize it for specific needs while saving time and money.