Used PIONEER LCP 1100 #9206956 for sale

PIONEER LCP 1100 is a prober used to test a variety of components and semiconductor wafers. LCP 1100 is capable of probing a wide range of components such as integrated circuits (ICs), passive components, semiconductor wafers, and other devices. It is a fully automated, high-resolution prober with multiple axis capability, allowing for quick probing across large component surfaces. The prober can support both contact and non-contact probing up to 2 microns, providing accurate and consistent results. This prober can also be used to test a variety of physical parameters, including capacitance, voltage and current, resistance, power loss and yield analysis. Its multi-axis design features an adjustable Z-axis for optimal positioning, a probe position adjusting base, vertical working surface, and linear drives, allowing for precise probing of components. PIONEER LCP 1100 is equipped with a floating table feature, which allows for rapid and consistent probe placement in various positions and orientations. Its high-speed pneumatic probe assembly and optional precision laser accuracy further enhance the versatility of the prober. LCP 1100 also features various software programs and application-specific capabilities for quick and easy test setup. Other key features of PIONEER LCP 1100 include a dynamic stepping feature, which automatically selects and steps between specified test sites; multi-feedback mode, which allows for custom test sequences; and a dynamic registration system, which permits the prober to test up to 20 different test sites in a single cycle. LCP 1100 prober is one of the most popular and reliable tools for testing components and wafers. Its versatile and robust design makes it an ideal prober for component testing, providing reliable hands-free tests with consistent and accurate data.