Used PROBING SOLUTIONS 400 #9004364 for sale

PROBING SOLUTIONS 400 is a prober used in the semiconductor and microelectronic industries for wafer probing and chip testing. It enables high-accuracy, automated static and dynamic testing of circuits and components. The prober utilizes a suite of ultra-precise, advanced test fixtures for probing with great accuracy and repeatability and a multi-element sensor platform that allows for high-speed, high-resolution capture of test data. It supports a wide range of wafers and substrates and provides multiple modes of testing for different device characteristics. The prober is designed with ease of use and flexibility in mind. It features a large liquid-crystal touch-screen panel which provides easy access to all operational modes and parameters. The prober also includes several graphical user interface (GUI) tools which enable users to quickly create and modify test patterns, apply bias settings, and automate test operations. Additionally, a high-speed communication interface enables users to easily integrate the prober with external computers and control systems. 400 prober includes a mechanical arm for precise and repeatable alignment of wafers and substrates for testing. Its spindle drive system is specially designed for high accuracy applications with peak accuracy of 25 µm on each axis and a repeatability of 9 µm. The prober also features a highly sensitive capacitance-sensing technology which enables accurate, repeatable measurements and a wide range of test currents. This results in highly accurate results with minimum sample manipulation, minimal probe force, and maximum speed. The prober also includes a variety of software tools for manual and automated testing. It provides a set of application programming interfaces (API) which allow users to develop custom scripts and software for testing. It also provides access to third-party software and hardware tools to further increase test efficiency, including a wide range of test heads, lasers, microscopes, particle counters, and other devices. In addition, its advanced metrology tools allow it to perform precise measurements such as sheet resistance, thickness, and contamination. In conclusion, PROBING SOLUTIONS 400 prober is an advanced testing solution suitable for the most demanding microelectronic and semiconductor testing applications. Its sophisticated mechanical arm, capacitance-sensing technology, and software tools provide ultra-precise and repeatable testing of a wide variety of wafers and substrates. Its multiple modes of testing, flexible interface, and powerful software make it an ideal choice for automated circuit and component testing.