Used QMC DPS 600 #293590698 for sale

QMC DPS 600 is an advanced prober designed for high-precision probing and testing of semiconductor devices. It is capable of performing up to 40 wafer or device tests simultaneously, allowing for fast and accurate testing of large batches of semiconductor products. DPS 600 is designed to provide stable and reliable probe positions that are maintained with the help of a precision air bearing and a high-resolution optical positioning equipment. This system is coupled with an advanced automated test program that can control the exact number of tests to be performed in a single cycle. QMC DPS 600 is built with a highly repeatable gantry stage, providing precise and reliable motion control. It is equipped with a high-resolution motion-control unit that enables real-time process control and ensures that tested devices meet the specified test parameters. Additionally, DPS 600 prober comes with two independent prober head assemblies, allowing for dual-site testing and enabling test cycles to be completed quickly. The prober features an adjustable chuck and a configurable wafer processing machine that allow for testing of a variety of wafer sizes and shapes. The testing area of the prober can be easily adjusted, allowing for flexible testing of small, thin wafers or large wafers up to 8 inches in diameter. The prober also comes with a built-in magnifying tool for improved imaging and error-checking, allowing for a more efficient testing process. QMC DPS 600 prober is an efficient and precise tool for testing and measuring the performance of semiconductor devices. Its advanced motion-control asset and automated test program provide precise, repeatable results that are repeatable with minimal human intervention. This prober can be used to quickly and accurately test and debug wafers, ensuring the products meet the specifications of their target market.