Used QMC DSR-600 #9144216 for sale

QMC DSR-600 is a versatile prober designed for wafer-level testing of semiconductor wafers. It is a horizontal-indexing, four-axis, semi-automated wafer prober that supports the testing of up to 600mm wafers. The machine offers a robust, reliable test environment and features a dual-sided vacuum and cooling equipment, allowing for improved test accuracy and longer wafer life. DSR-600 has two optical channels with a high-resolution optical microscope and laser alignment further enabling reliable test and validation performance. The system is equipped with a sophisticated automation package that can be programmed with customer-specific test programs. It enables complex multi-level testing scenarios including scanning, all-site testing, localized testing, thermal cycling, and leveling. It includes a Linear Scan Table (LST), which permits multiple wafer sites to be tested simultaneously, speeding up the testing cycle and improving test accuracy. It also supports up to eight probes, which can be configured in two or three-level configurations to support different site testing requirements. QMC DSR-600 offers numerous built-in features for safety and accuracy. It includes a high precision anvil for accurate mechanical alignment of the probe. It is equipped with an automated wafer edge clamping unit that applies pressure on the wafer edge for maximum accuracy and safety. The machine also includes an emergency shutoff along with test cycle pause and resume. The tool provides good exchange rates with various prober packages, vacuum chamber covers, and sub models. It has a simple, user-friendly interface and its open architecture design provides advanced asset diagnostics and minimizes maintenance time. Furthermore, the flexibility of the platform allows for the integration of custom software and customized test configurations. DSR-600 is a high performance wafer prober that can help manufacturers quickly and accurately test and validate semiconductor wafers.