Used RUCKER & KOLLS / R&K 250 #65587 for sale

Manufacturer
RUCKER & KOLLS / R&K
Model
250
ID: 65587
Wafer Size: 4"
Probe station, 4" 4"x4" travel with 4" chuck Includes B&L stereo zoom 4 optics Upgrade to zoom 5 for an additional cost.
The Rucker and KollsRUCKER & KOLLS / R&K 250 is a high-precision, rugged prober designed for the precise probing of electrical and optical properties of electronic and optoelectronic components. It is a fully automated, programmable, capacitance measurement system that utilizes automated probing, precise capacitance measurements and industrial-grade precision. It is a modular prober that can handle a wide range of materials and applications, including semiconductor processing, device test, hybrid integrated circuits, material analysis, and more. The Rucker and KollsR&K 250 is designed for increased accuracy and quick measurements, allowing for detailed analysis. It has a high-performance probing head and rapid data acquisition rate. Its LED arrays provide accurate and precise position information for the probe head. The prober also features a flexible computer-controlled interface, with the ability to store multiple test configurations and transfer them to the prober. The Rucker and KollsRUCKER & KOLLS 250 features an intuitive and easy-to-use PC software, which enables the user to set up tests quickly. It also makes it possible to display waterfalls, where different capacitance measurements are compared to other measurements. The prober is also compatible with various industry standard and custom IC test packages, allowing for accuracy and a greater range of data acquisition. The prober is designed to handle single layer chips, multiple layer ICs, and more. The prober also offers the option to expand its functionality with specialized instruments and add-on software solutions. The Rucker and Kolls250 is a reliable and versatile prober, designed to meet a variety of application needs. Its accuracy, repeatability and programmability make this prober a great choice for electronic and optoelectronic component testing.
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