Used RUCKER & KOLLS / R&K 400 #9018535 for sale

RUCKER & KOLLS / R&K 400
Manufacturer
RUCKER & KOLLS / R&K
Model
400
ID: 9018535
Probe station.
RUCKER & KOLLS / R&K 400 is an advanced prober used for high precision testing of ICs and other sensitive components. It is an ultra-high precision, fully automatic prober designed to identify, assess and troubleshoot a wide range of high complexity components. The equipment includes an integrated optical microscope, a powerful imaging system, and a low-temperature environment, allowing for fast and accurate assessment of a wide variety of components. R&K 400 is capable of providing accurate analysis of chip layout, measure die bond wires and components, detect defects, measure package variables from the printed circuit board (PCBs) and other subsystems, and remove the need for manual adjustments. It also features vibration compensation, automated test vector adjustments, and a versatile probe interface. RUCKER & KOLLS 400 features a high-resolution camera, which offers a magnification range from x4 to x60. The camera can record images for post-analysis and archiving. The imaging unit also includes the ability to control intensity, focus, and image area size. The probe interface offers superiorly accurate alignment, allowing for precise probing of the target component. The machine also features a full range of environmental controls, including temperature, humidity, and airflow speed. This allows users to precisely simulate and monitor different test environments, making the tool suitable for a wide range of applications. Additionally, 400 also includes advanced automated stitching process capability, integrated digital data handling and storage, and easy-to-use graphical user interface. RUCKER & KOLLS / R&K 400 is a versatile and reliable tool for high precision testing of components. Its advanced optics, precisely controlled environment, and camera allow for the analysis of a variety of mechanical, electrical, and optical performance parameters. It is an excellent choice for testing small, complex semiconductor components, providing accurate assessment data to achieve high yields.
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