Used RUCKER & KOLLS / R&K 660 #9004670 for sale

RUCKER & KOLLS / R&K 660
Manufacturer
RUCKER & KOLLS / R&K
Model
660
ID: 9004670
Manual prober With Bausch and Lomb microscope.
RUCKER & KOLLS / R&K 660 is a specialized prober for electrical testing and device analysis in IC, packaged device and system-level. It is an economical and efficient tool for complex measurements. Equipped with high-accuracy, low-noise test stages, R&K 660 provides superior performance for a wide range of electrical testing and device analysis applications. RUCKER & KOLLS 660 has a flexible probe network that can be tailored to the needs of each test. Its programmable source measurement unit (SMU) and direct view display provide the operator with precise information and maximum performance. 660 also has a high accuracy pulse generator with a programmable frequency range from 10 Hz to 40 MHz. RUCKER & KOLLS / R&K 660 can also be used to measure switching characteristics of devices such as Schottky diodes and multi-pin components. R&K 660 has both source-measurement functions and a three-terminal capacitance tester. The three-terminal capacitance meter measures and displays both the capacitance of shorted capacitors and the resistance of normal resistors. RUCKER & KOLLS 660 is a highly reliable and repeatable tool that allows users to perform precise and accurate measurements while maintaining a high quality and price performance ratio. The user interface on 660 is designed to make measurements fast and easy. It features an intuitive menu structure to guide tests and functions. RUCKER & KOLLS / R&K 660 also features a real-time monitor and control system, enabling the testing and analysis of ICs, packages, and systems in real-time. R&K 660 corresponds to the novel IEEE-488.2 IEEE Standard, making it also compatible with a wide range of probes, meters, components, and other equipment. Overall, RUCKER & KOLLS 660 is an economical and efficient tool for electrical testing and device analyses. Its features allow for accurate testing and analysis, while at the same time providing a cost-effective solution for complex measurements.
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