Used RUCKER & KOLLS / R&K 667 #65588 for sale

Manufacturer
RUCKER & KOLLS / R&K
Model
667
ID: 65588
Wafer Size: 6"
Manual probe station, 6" X-Y travel, 6" B&L Micro zoom optics: Up to 2000X (2) Objectives.
RUCKER & KOLLS / R&K 667 is a prober designed for high-speed probing of bonded and unbonded wafer test applications. The probe card equipment accepts any type of probing needle, and offers flexible control, calibration, and diagnostics capabilities. It is designed with an advanced wafer probing system to obtain the highest possible probing accuracy with minimal force. The unit supports up to 8 sites simultaneously and features optical and electrical error checking for fast and accurate testing. The prober features a lightweight, ergonomically designed aluminum frame that is designed for reliable and easy access to test points. Its advanced probing machine integrates two integrated optical sensors that allow for quick and accurate visual alignment of test sites and faster identification of probe contact points. In addition, its patented probing technique minimizes probe movement and contact force, resulting in stabilized probes even in high frequency applications. It also includes adjustable chuck pressure and biased alignment rings, to provide reliable and repeatable probing without excessive force or damage to probes or test sites. The prober also offers an automatic test adaptor (ATA) that provides efficient and reliable Wafer ID and barcode recognition, standard file formats and secure online wafer ID matching capabilities. Its built-in probing and data logging tool, along with the ATA, allows for more efficient and accurate testing. Additionally, the asset can be interfaced with various custom software for detailed analysis of data. R&K 667 prober is designed to provide reliable and fast automated test data for all types of bond testing. Its advanced features and capabilities have made the model a must have for testing applications in the electronics, automotive and aerospace industries. The equipment offers a range of wafer probing options and has the flexibility to be adapted to existing systems, allowing for a highly efficient and accurate overall test process.
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