Used SEMES IP300H #9352871 for sale

SEMES IP300H
Manufacturer
SEMES
Model
IP300H
ID: 9352871
Wafer Size: 12"
Prober, 12" With cold option.
SEMES IP300H is an advanced prober designed and engineered by SEMES Corporation. It is designed to provide high accuracy and repeatability of probing solutions. It is a fully automated and modular equipment capable of supporting multiple measurement tasks in a single platform. IP300H offers high accuracy and repeatability, allowing for precise probing results. It is capable of accurately measuring properties such as capacitance, resistance, voltage, frequency, polarity, and gain. The system is equipped with a number of advanced features to improve its performance in performing tests and extracting data. SEMES IP300H is capable of measuring over 40 probe patterns. The unit includes edge probes of various shapes and sizes with different available probe tips. The probes are designed to interact with the sample under test with minimum contact force. IP300H has sophisticated software and communication capabilities, allowing for easy integration into other tools used in test and measurement operations. It has an intuitive interface, making it easy to use and configure the prober. It can also be operated remotely with a web-based interface. SEMES IP300H is equipped with a powerful data acquisition machine that can collect a wide range of parameters, making it suitable for a range of applications. It is equipped with an advanced probe calibration tool, allowing the prober to accurately measure a wide range of parameters. IP300H is equipped with an automated defect recognition asset to identify defects and other irregularities in signals or values during testing. It is also equipped with a pattern recognition feature that can recognize patterns created by multiple probes. Overall, SEMES IP300H is a powerful and versatile prober, providing users with accurate and repeatable probing solutions. It can be used for a wide range of application requirements, making it a valuable tool for test and measurement operations.
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