Used SEMICS MP700-75 #9387233 for sale

SEMICS MP700-75 is an automated prober designed for semiconductor wafer testing. It is engineered to provide high accuracy, performance, and efficient wafer probing with a wide variety of contact materials. MP700-75 has a high contact force of up to 75 cN (Newton) and narrows the gap between wafer and probe card to minimize contact force variations. It also has a quick-change chuck feature, which enables the user to conveniently and easily switch between wafers for testing different materials or processes. SEMICS MP700-75 has a robust wafer chuck which supports wafer sizes up to 200mm with a maximum size of 346 x 346mm. It also provides a wide range of probing angles and position precision to ensure accurate contact placement. The equipment has a range of translation stages to facilitate wafer alignment and scanning and a laser enhanced digital microscope to allow for real-time visual monitoring of the probing process. MP700-75 also employs advanced automation and robotics features. The wafer acquisition system uses robotics arms to transport wafer from cassette to chuck. It also has a patented wafer protection unit to ensure that the wafer is safe during the probing and handling process. The machine employs automatic wafer centering and wafer scratch detection capabilities, which also improves the accuracy of the probing process. Furthermore, patient safety is ensured through high-end probe cards that are equipped with a solid contact and stable spring design. SEMICS MP700-75 also offers integrated process control and diagnostic software to monitor, analyze, and repair any probing issues. All in all, MP700-75 is an advanced automated wafer prober that offers superior accuracy, efficiency, and performance. It is a great choice for production, failure analysis, and reliability test applications.