Used SEMICS Opus II #293586055 for sale

SEMICS Opus II is a prober for testing and measuring the electrical characteristics of semiconductor chips. It is designed to provide reliable electrical testing and measurements of semiconductor chips at the highest possible precision and accuracy. It is capable of providing accurate testing of various types of individual dies that are placed on a single tape or film and/or on a multi-layered substrate. Opus II utilizes various techniques including RF contactless, UHV, XPS and WDX for testing contactless probes combined with a set of wafers equipped with patterning and windowing solutions. The equipment is designed to provide highly accurate measurements over small areas and large areas. The use of contactless probing enables contactless testing of the chip and reduces the risk of surface or mechanical damage to the semiconductor chips. It also helps reduce the risk of misalignment and surface contamination by minimizing the areas of contact and potential arcing. SEMICS Opus II is powered by the SINGLS (Single and Large Surface) Probing system, which uses a combination of contactless and contact-based technologies for testing probes. This unit allows for parallel probing of multiple sample layers and wafers, enabling more accurate and efficient testing. Additionally, the machine has an automated wafer handling tool that allows for automated sampling and loading of wafers. The asset also uses corrected frames for testing of up to three different sizes of surfaces, allowing for more accurate and faster testing. Opus II has an integrated analysis suite which provides comprehensive tools for analysis and evaluation of the electrical characteristics of semiconductor chips. The suite includes features such as spectral, spectral imaging, and measurement analysis tools, all of which can be used to determine the electrical characteristics of semiconductor chips. Additionally, the model provides a trace viewing that enables users to quickly analyze their measurements and analyze the results. SEMICS Opus II is a versatile and powerful prober for testing and measuring the electrical characteristics of semiconductor chips. It is designed to provide reliable testing and measurements of semiconductor chips, with a high level of precision and accuracy. The equipment also has automated loading and testing capabilities, as well as an integrated analysis suite for data analysis and evaluation. The system is suitable for complex testing applications, and is the ideal choice for advanced testing requirements.