Used SEMICS Opus II #293645158 for sale

SEMICS Opus II is a high performance prober for the semiconductor industry. It is used for testing, characterization and debug of semiconductor devices and integrated circuits (ICs). The prober provides a complete set of features and capabilities, including probing, imaging and electrical characterization. It has an automated, programmable interface and comprehensive test routines that allows a user to quickly and accurately analyze components, chips, packages and boards. Opus II prober offers a wide range of technical features and options that make it suitable for a variety of industrial and research applications. This prober is capable of performing a variety of physical tests, including contact resistance testing, air gap measurement, dielectric breakdown voltage testing, electrostatic discharge (ESD) testing and electrical performance monitoring. In addition, the equipment offers advanced imaging capabilities, allowing users to capture high-resolution images of the device under test, enabling quick and accurate analysis. SEMICS Opus II prober also includes an integrated vacuum microprobing system, allowing for high-precision probing and imaging with minimal contact manipulation. The unit incorporates advanced software for real-time monitoring of electrical signa and monitoring of contact force. An optional Autocalibration feature adds the ability to monitor and adjust for the thermal drift of the prober's force measurement machine. The tool also offers powerful data acquisition and analysis capabilities, with data logging and visualized analysis capabilities. The analysis functions allow a user to inspect statistical data such as mean, standard deviation and histograms, as well as customizable graphical tools that allow detailed analysis of the contact performance parameters. Opus II prober also includes a reliable probe card change facility and an intuitively designed GUI, making it easy to operate. SEMICS Opus II is an efficient, precision tool for the testing, characterization and debug of semiconductor devices and integrated circuits. Its advanced features and options make it suitable for a variety of industrial and research applications, helping to ensure the highest level of performance.