Used SEMICS Opus II #293714774 for sale

SEMICS Opus II is a next-generation prober, designed for testing advanced devices in automated wafer testing applications. It provides the capability to meet the challenging requirements of next-generation wafer test applications. Opus II has improved and extended features compared to existing platforms used in semiconductor testing. SEMICS Opus II is an advanced prober that provides high throughput with high flexibility. The mechanisms included in the design ensure accurate device consistency characterization. Opus II is engineered with VXI controllers and advanced test measurement instruments for measuring electrical and optical parameters of devices. The equipment accurately measures device characteristics with statistical confidence. SEMICS Opus II prober is equipped with an advanced electrical test system, which utilizes the latest technologies and instruments for accurate measurement of device parameters. The electrical test unit integrates custom probes, custom punch-cards, and a wide range of application-specific test instruments. The custom probes provide direct contact to device contact pads, while the custom punch-cards reduce the number of cycles required to perform testing. The machine is also outfitted with optical testing instrumentation, such as cameras and lasers, for further analysis of semiconductor devices. The optical testing enables further characterization of the devices, such as die and wafer maps, and it performs full wafer testing with high precision. Additionally, the prober is equipped with a temperature and humidity chamber, which is used to measure the effects of environmental conditions on device performance. The prober's integrated software suite provides advanced features for comprehensive analysis of test results. The software suite includes several modules such as prober control, test-measurement, analysis, and data-storage. The software can be configured to meet the requirements of the application, and it also includes educational materials for using the prober. Opus II prober is an effective tool for testing next-generation advanced semiconductor devices. It is designed with advanced features to provide accurate measurement of device characteristics and ensure precise analysis of test results. The integrated software suite provides a range of features, including prober control, test-measurement, analysis, and data-storage. The software is also easy to configure to meet application requirements. The prober is suitable for a variety of wafer test applications, including advanced devices.