Used SEMICS Opus II #293731357 for sale

SEMICS Opus II is a prober designed for use in silicon wafer probing testing. The device utilizes contactless positioning technology along with precision mechanical components to accurately and efficiently probe the surface of a semiconductor wafer. Opus II is specifically designed to support the most advanced wafer probing requirements such as integral advanced testing and validation of power and analog chip devices. SEMICS Opus II machine is built with an advanced controller, motion controller, and programmable software to control the direction of movement for selected probes. The machine can be customized to support a wide range of testing requirements, including pattern probing and electrical parameter measurement. The device has a high resolution optical system for precise scanning imaging capability which is used to align probes for maximum accuracy. The machine is fitted with precision probe tips and an adjustable base plate which allows the user to adjust wafer alignment angle. In addition, an integrated vision system provides graphical display of the chip layout for precise alignment of the probes. The probe tips may be further customized to suit the specific requirements of the customer. In addition to its real-time positioning and precise scanning abilities, Opus II is also capable of performing concurrent testing that allows for faster testing throughput and higher yield values. This device also has robust connectivity options with Ethernet communication protocol and compatible interfaces for external systems. SEMICS Opus II comes with a range of safety features, such as protection against damage due to electrostatic discharge, infrared radiation, and gas supply. Overall, Opus II is a powerful prober with a variety of advanced features and capabilities that make it ideal for testing and validating modern silicon wafer fabrication. It is capable of performing rapid and precise testing and validating, while providing reliability and robustness to ensure high rate of test efficiency. Its modular design makes it easy to use, and the modularity of the device allows for rapid reconfiguration and customization when required.