Used SEMICS Opus II #293731359 for sale

SEMICS Opus II is an advanced prober developed by SEMICS for testing semiconductor wafers and integrated circuit chips. It provides the capability to probe and verify components, releasing the full potential of the device. The equipment has a unique set of tools for rapid and accurate testing, measurement, analysis and optimization. These tools include a full-color video display, multi-layer probing software, an advanced throughput prober controller, and a data acquisition and analysis system. Opus II unit is equipped with a powerful throughput prober controller, designed for fast, accurate, and reliable wafer probing operations. Its modular design and user-friendly operator interface make it simple to use. Its efficient wafer probing mechanism eliminates instances of poor electrical contact, and it is able to support simultaneous probing of multiple wafer positions. SEMICS Opus II machine is also equipped with a high resolution multi-layer probing software. This tool enables users to quickly probe more than ten thousand test points on semiconductor wafers or integrated circuit chips, and it can verify the integrity of the device geometry. The software supports various measurement and analysis tasks, allowing users to evaluate component behavior and reliability. The tool also features an advanced data acquisition and analysis asset. This model is capable of collecting data from the multi-layer probing software, while providing the ability to analyze, graph, report and control the evaluation process. It is designed to enable maximum test coverage and minimize the time to evaluate components. The equipment also supports various fault isolation techniques, such as pattern matching and time slicing. Finally, Opus II system is equipped with a full-color video monitor, enabling the user to observe device behavior and live prober animations. This real-time visualization aids in understanding device behavior and in developing improved probing strategies. Overall, SEMICS Opus II is an advanced, easy-to-use prober unit, capable of rapid and accurate testing, measurement, analysis and optimization. Its user-friendly operator interface, multi-layer probing software, throughput prober controller, and real-time visualization machine provide the user with the capability to probe semiconductor wafers and integrated circuit chips accurately and effectively.