Used SEMICS Opus II #9119446 for sale

SEMICS Opus II is an advanced technology prober that is used for contact, non-contact, IC component, and semiconductor wafer defect analysis. Designed for high accuracy and repeatability, Opus II accurately and quickly detects and discriminates minute defects on wafer surfaces and in wires and contact pads. SEMICS Opus II operates in temperature-controlled environments and features advanced optics and source alignment with a patented wafer orientation system. The prober's optical systems include a variable focus zoom lens and a piezo-electric XYZ stage, allowing the technician to manually adjust the zoom lens and probe position on the wafer. In addition to its high-resolution optics, Opus II is equipped with advanced contact and non-contact sensors that are capable of detecting invisible defects in structures at extremely high speeds. The sensors are capable of picking up even small structural defects, such as variations in circuit density. The prober also incorporates a high-resolution CCD camera and a highly sensitive IR camera. The CCD camera captures images up to 8 million pixels in size, while the IR camera picks up the minute changes in temperature emitted by slightly defective areas. For troubleshooting and debugging, SEMICS Opus II includes an invaluable testing suite that provides valuable statistical analysis, fault detection and computer-simulated failure analysis. The prober's state-of-the-art data acquisition and analysis capabilities are available with real-time updates. Opus II is designed for rapid identification of product-related defects, helping to reduce product costs, reduce production downtime, and increase product quality.