Used SEMICS Opus II #9184456 for sale

SEMICS Opus II is a prober designed for advanced wafer testing and circuit evaluation of semiconductor devices. It is a fully automated, state-of-the-art machine for advanced characterization, yield validation and device testing. It features a variety of control and measurement systems with a user-friendly interface and easy-to-use software. Opus II is designed to support traditional electrical testing methods such as high voltage, low voltage and current measurements as well as advanced dynamic testing protocols. It features both contact and non-contact testing capabilities and supports multi-beam testing to enable multiple tests on a single chip. SEMICS Opus II can be used to wafer-level testing with built-in functions for rapid defect localization and a suite of advanced fault isolation capabilities. Its support for DC and dynamic tests combined with its ability to perform parametric and small-signal device testing make it especially suitable for yield analysis, reliability testing, quality assurance and failure analysis. On the software side, Opus II includes a comprehensive suite of automated device characterization and parametric testing tools. It has a high level of customizability and supports full automation of the testing process. It also offers detailed reporting and traceability features to ensure that all test data are securely stored and easily accessible. SEMICS Opus II is an ideal solution for semiconductor device manufacturers looking for a reliable and cost-effective prober system. It combines ease-of-use with advanced testing capability to provide reliable and comprehensive wafer testing. It is built to meet the needs of both production testing and research and development.