Used SEMICS Opus II #9184457 for sale

SEMICS Opus II is a state-of-the-art prober used for probing advanced semiconductor circuits. It is capable of performing a wide range of probing and test operations, with a maximum resolution of 25 nanometers. The unit is equipped with a 125um OmnimatrixTM probe card that has on board vision and imaging capabilities. It features a precision sample stage with a proprietary photonic beam and advanced automation features. With a 24" x 24" working area, the Optus II can probe large devices, such as system-on-chip (SoC) designs, and the advanced optics provide high-resolution probing capabilities on both sides of the die. The Optus II is capable of probing various types of devices, including high pin-count ICs, stacked die configurations, MEMS devices, TSV packages, and Cu/Si/G/ckt packages. Its automated calibration reduces manual alignment time and results in minimized probe damage. The probe uses a two-lens optical system for automated beam focusing and alignment. It also supports automated probe calibration and coordinate alignment for precise signal pickup and reliable test results. The Optus II is capable of providing accurate, repeatable testing for semiconductor devices, with minimal operator involvement. Its automated test and probing capabilities can save valuable time and reduce human error. The unit also supports advanced automation features, such as programmable probes and auto-stop. This reduces the need for manual probing operations and enables fast, automated, and accurate probing of semiconductor devices. The Optus II's automated optical scanning capabilities allow for superior resolution and narrowing of probing services. This translates to increased sensitivity and accuracy of results. It also features low-noise, high-accuracy probing and test capabilities, resulting in reliable test results. The unit is capable of operating in single or multi-die mode, providing flexibility for high-volume production runs. Opus II is a powerful prober that is well-suited for advanced probe and test operations. It features a 125um OmnimatrixTM probe card that provides superior resolution, low-noise, repeatable testing, and advanced automation features. With a 24" x 24" working area, the Optus II can probe large devices, such as system-on-chip (SoC) designs, and automated optical scanning capabilities allows for finer probing services and more accurate results. The Optus II is ideal for probing high pin-count ICs, stacked die configurations, MEMS devices, TSV packages, and Cu/Si/G/ckt packages, with minimal operator involvement.