Used SEMICS Opus II #9268979 for sale

Manufacturer
SEMICS
Model
Opus II
ID: 9268979
Vintage: 2007
Wafer prober Chuck, 12" 2007 vintage.
SEMICS Opus II is an advanced probing equipment for advanced semiconductor device analysis. The system is used to evaluate the electrical properties of devices and helps to optimize their performance. It consists of a set of individual probing components including a controller, processor, and software. The controller is the heart of the unit and manages the probing functions. It consists of a DC Power Analyzer, Probing Head, and a Motorized Linear Actuator. The DC Power Analyzer is equipped with a high voltage isolation switch to ensure user safety and an independent SMU that allows for accurate step voltage measurements. The Probing Head supports several probes in order to detect even the most complex and minute transistor parameters. The Motorized Linear Actuator enables fast and precise positioning of the probes to analyze multiple points in a single device. The processor is responsible for the scheduling of probing operations and provides an intelligent algorithm to ensure effective probing performance. It is also responsible for data collection and analysis via a customized software package. The software is an integral part of the machine and consists of various modules such as the Test Development Module, Test Run module, Test Result Analysis, and Parameter Extraction & Modeling. The Test Development Module allows users to explore the various parameters of the device which can then be tested via the Test Run module. This module provides users with graphical analysis and report management capabilities. The Test Result Analysis enables users to extract meaningful data and parameters from the results. This data can then be modeled to find relationships between parameters and enable further optimization. All in all, Opus II prober is an advanced tool for semiconductor device analysis. It consists of a robust controller, processing section, and software that allows users to fully explore and model the characteristics of devices. With support for various types of probes and a range of intelligent algorithms, the asset provides the ultimate in efficient data collection and analysis.
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