Used SEMICS Opus II #9280522 for sale

SEMICS Opus II is an automatic prober developed by SEMICS, Inc. It is an intelligent automated wafer inspection and probing equipment that is designed to streamline the process of quality assurance testing. It is capable of detecting minor defects and contamination in samples with a high rate of accuracy and speed. The system is also equipped with a multi-channel prober and can measure multiple parameters such as contact resistance, current, voltage, on and off times, contact force, channel separation and contact angle. Opus II is well-suited for a wide variety of applications, including wafer mapping, device characterisation, failure analysis and quality assurance testing. It operates using a two-dimensional mark-sense algorithm which detects the presence of metallic or organic contamination on wafer surfaces. The unit can provide accurate results when verifying the cleanliness of silicon wafers, and it can also be used for testing integrated circuit components. It is also capable of measuring contact resistance on a full wafer. SEMICS Opus II is equipped with advanced safety features. The probe is programmed to stop testing if a force threshold is exceeded, and it is designed to prevent electrical overstress (EOS) conditions from occurring. It is also capable of detecting electrical interference. The machine is designed to be compact and lightweight, making it easy to move from one location to another. Its intuitive user interface allows for quick and easy operation. Its automation features reduce the amount of time required by operators to complete testing tasks. Opus II is incredibly reliable and consistent. It offers good performance, repeatability and a long calibration time-frame, making it a great choice for both development and production wafer testing. Overall, SEMICS Opus II is an exceptional prober. It is extremely accurate and reliable, and it offers excellent value for its price. It is a good choice for production and research laboratories, as it can provide precise and repeatable test results. Its simple user interface, advanced safety features and outstanding performance make it an ideal solution for many wafer testing needs.