Used SEMICS Opus II #9300096 for sale

SEMICS Opus II is a scanning electron microscope (SEM) prober equipment designed for testing and probing high frequency analog circuitry. It is capable of testing DC and multi-MHz RF circuits on substrates including silicon, gallium arsenide, and glass. The system includes a precision surface tilt platform, a high-precision XYZ sample stage, an index tool chuck rotating at a speed of 4 rpm, as well as a full RF unit including signals sources, probes, multifunction switch, directional coupler and integrated RF amplifier. Opus II features high energy electron beam for testing high-frequency components and exhibits a highly stable and accurate alignment capabilities using high resolution optical encoders for nanosecond-domain pulse widths. It is also capable of testing devices up to 1.5 GHz and provides excellent surface quality for various materials such as aluminum nitride (AlN), aluminum oxide (AlOx), and polyimide (PI). In addition, the machine can generate multiple scan rates from 1.5 μm/sec to 333 μm/sec using the optional automated scan speed control. The tool is equipped with heated sample stages and a vacuum interface unit which allow users to access high vacuum conditions, and also includes manipulators for device handling and proximity sensors. The asset features a compact design making it easy to set up and install, and the included software allows operators to easily control and monitor model operations. With its automated functions, SEMICS Opus II can operate with a signal accuracy rate of up to 0.040%. Overall, Opus II is a high-end scanning electron microscope equipment that provides accurate and repeatable testing for circuits on high frequency devices and substrates. Its compact design makes it easy to install, and its robust features allow users to perform high precision probing in minutes. With its automated functions, users can monitor and control operation quickly and easily.