Used SEMICS Opus II #9383805 for sale

SEMICS Opus II is an automated wafer prober and metrology equipment that provides a host of capabilities for the testing and characterization of semiconductors. Utilizing the latest advances in robotics and automation, this system provides a fully automated solution for large volume production testing needs. Opus II unit provides a comprehensive suite of test and characterization capabilities for a variety of semiconductor devices including flash, DRAM, ASICs, MCUs, and EPROMs. The Machine consists of three main components: a robotics unit, an automated handling unit, and a measurement station. The robotics unit moves the wafers to and from the Analysis Station. It also handles the wafer transfer from the vacuum chucking tool, the random positioning of the wafer for alignment, and the movement of the wafer to and from the metrology station. The automated handling unit is responsible for the continuous flow of wafers throughout the asset and is equipped with a fault detection model. This feature is essential for automated systems in order to identify any wafer related faults that may occur during the production process. Finally, the metrology station consists of two tools: a laser scatterometer which is used to acquire surface topology data, and a scanning electron microscope which is used to map the patterned surface of the wafers. SEMICS Opus II is designed to fit into a variety of existing production lines, with a wide range of integration options and a host of advanced control functions. This includes the use of advanced computer-controlled wafer handling techniques that enable smooth operation and low particle generation. These computer-controlled methods can be customized to meet a variety of criteria to suit the specific needs of the user. The metrology station features a custom-built semiconductor-specific software platform that offers a range of measurement and analysis capabilities. For large production runs, this equipment's high accuracy and repeatability enables significant cost savings as a result of improved test repeatability and throughput. Furthermore, Opus II can detect subtle changes in the wafers over time, ensuring that yields remain high and rejecting those wafers that do not meet the quality standards. The system also meets all semicon-specific safety standards, providing a reliable and secure working environment for its users. Overall, SEMICS Opus II is an all-in-one wafer-testing and metrology unit that streamlines the production process by providing a cost-effective and efficient solution for the testing and characterization of semiconductor devices.