Used SEMICS Opus II #9407027 for sale

SEMICS Opus II is a prober designed for testing and inspecting packaged devices such as memory and logic integrated circuits, as well as other devices with flat surfaces and high aspect ratio connectors. It is an automated wafer prober that enables fast, accurate, and reliable sample inspection. This prober includes four positional scanning stages and a precision flexure-guided stage for samples up to 200 mm in size and up to 500 m in height. It features a high speed motion control capable of achieving up to 20 µm positioning accuracy which enables rapid sample alignment and positioning. The prober utilizes advanced vision technology and automated wafer alignment that allows for quicker and more accurate sample verification. Opus II prober also features a variety of probing solutions including contact, gloveless, or infrared probing capabilities. In addition, the device is equipped with an adjustable optical microscope and imaging system offering high-resolution imaging capabilities and can detect minuscule defects. Furthermore, the prober has built-in self-diagnostics to monitor operational parameters and alert the user to any issues. This ensures reliable performance and quick troubleshooting. Additionally, the system includes SEMICS proprietary software for easy coordinates programming, and powerful editing routines, as well as support for data analysis and export. For ultimate safety, SEMICS Opus II prober comes with a variety of safety upgrades including a user friendly access port, automatic emergency shut off switch, and ESD protection.