Used SEMICS Opus II #9407030 for sale

The Semiconductor SEMICS Opus II Prober is a powerful system for advanced probing and testing of semiconductors. It is designed to test both wafer-level and packaged devices, as well as transistors and diodes. The system allows for improved circuit performance, better yield, and cost savings. The Prober features a number of electronics components and functions, including a controlled temperature environment, high-accuracy probe head, micromanipulators for probe placement, programmable semiconductor test parameters, and embedded test software. Its temperature range is from -50 to +120 degrees Celsius, with a precision resolution of 0.01 degrees Celsius. The Prober's advanced probe head is capable of an accuracy of 0.03 μm, and it supports High Frequency probing at up to 1GHz. In addition, it is equipped with world-leading manipulation systems to guarantee accurate and repeatable probe placement during semiconductor testing. The Prober also provides a wide range of automated test capabilities, including wafer pattern recognition, 3D mapping of faults, full voltage and current report, complete surface scan, and high-speed cantilever-based testing. Its flexibility and accuracy allow even the most complex designs to be tested efficiently. Furthermore, the Prober can sequence 4-, 5-, 6-, and 8-stringed substrates with appropriate min and max die-to-die delay sequences. Additionally, it can also program multi-level test strategies, up to two sub-levels within each test level. Overall, the Semiconductor Opus II Prober is an effective solution for semiconductor testing and probing. It is highly reliable, accurate and efficient, offering an array of features which reduce product costs and ensure high yields. The Prober's combination of automated test capabilities, advanced probe head, flexible temperature range, and programmable test parameters make it a perfect choice for any semiconductor testing and probing needs.