Used SEMICS Opus II #9407032 for sale

SEMICS Opus II is a semiconductor prober designed for the electrical characterization of wafers and other types of packaged semiconductor devices. The prober is capable of wiring, testing, and monitoring parameters such as, but not limited to, drain currents, supply voltages, and temperature. It is designed for physical verification of electrical interactions between the device and its associated environment. Opus II is based on a parallelizabale instrument platform that combines a single-axis manipulator with a multi-channel sensing and power supply equipment. The manipulator can traverse the device via a 500 mm X-Axis range and 100 mm Y-Axis range. The platen is compatible with 50 and 100 mm wafers as well as other configurations. Its multi-channel sensing and power supply system includes volatile and non-volatile memories of up to 256 channels, 6 Volt Grids, and 8 user-selectable DC supply voltages. It also has an additional user-selectable DC current measurement. The prober also contains several safety features. A safety lock prevents the user from operating the unit in the event of an emergency. It also features an Auto Retrace machine for quick and accurate alignment of the test probes. This enables consistent testing regardless of changes in the environment or sample. Other features that contribute to the prober's operating performance and accuracy include precision communication circuitry and advanced digital signal processing. The prober is powered by an Allen-Bradley Compact control tool, providing the hardware and software necessary for rapid and accurate testing of wafer and device packages. It includes packaging drawing, path design, cross section analysis, and correction's of test parameters. It also has several standard test functions that include, but are not limited to auto-routing of probes and automated storage of results. Overall, SEMICS Opus II is a powerful and dependable prober designed for the electrical characterization of both packaged devices and wafers. Its accurate and programmable features, along with the powerful control asset, make it suitable for a wide variety of testing requirements.